PEREVOZNIKOV, S. I.; KRUPELNYTSKYI, L. V.; OZERANSKYI, V. S. Features of formation of component structures in-circuit test systems for fails of digital devices. Visnyk of Vinnytsia Politechnical Institute, [S. l.], n. 5, p. 81–85, 2010. Disponível em: https://visnyk.vntu.edu.ua/index.php/visnyk/article/view/1310. Acesso em: 16 jul. 2024.