KYCHAK, V. M.; MYKHALEVSKYI, D. V. Method of relative forecast of electronic equipment reliability by the level of low-frequency noise. Visnyk of Vinnytsia Politechnical Institute, [S. l.], n. 5, p. 141–146, 2010. Disponível em: https://visnyk.vntu.edu.ua/index.php/visnyk/article/view/1785. Acesso em: 16 jul. 2024.