Automation and information-measuring equipment
Symmetrically-structured STIF detectors in system measuring devises of microwave parameters of paths
Keywords
system sensor
metrological reliability
microwave detector
reflectometer
attenuation gauge
Abstract
Structural solution of system SHF detector measuring devices of microwave parameters of tracts with high metrological reliability and accuracy, which allow to decrease prevalent instrumental error reflectometer and attenuation gauge, is suggested.
How to Cite
[1]
“Symmetrically-structured STIF detectors in system measuring devises of microwave parameters of paths”, Вісник ВПІ, no. 5, pp. 30–33, Nov. 2010, Accessed: Nov. 14, 2026. Available: https://visnyk.vntu.edu.ua/index.php/visnyk/article/view/500
