ESTIMATION OF CURRENT FLUCTUATION SPECTRAL DENSITY IMPACT ON JOSEPHSON JUNCTION GENERATION LINE WIDTH

Abstract

Impact of low-frequency and high-frequency current fluctuation spectral density of ordinary electrons and a Cooper pair on single Josephson junction generation line width has been researched.

An opportunity to reduce the generation line width and to increase output power due to optimal allocating several Josephson junctions in a microstrip superconducting line has been considered. Influence of electrodynamic coupling circuits on the generation line width has been examined. It has been shown that a choice of Josephson junctions optimal allocation in microstrip superconducting line and electrodynamic coupling circuit parameter selection permittedto increase power almost in 4 times and to reduce the generation line width almost by an order when putting 4 and 6 Josephson junctions in the microstrip superconducting line.