Radioelectronics and radioelectronic equipment manufacturing

Mathematical noise model of integral operational amplifiers for reliability forecast by the level of low-frequency noise

Authors

V. M. Kychak
D. V. Mykhalevskyi

Keywords

mathematical model operational amplifier noise model low-frequency noise equivalent noise voltage

Abstract

The mathematical noise model of operational amplifiers is offered, for forecast of their reliability by the level of low-frequency noise on the stage of manufacture and input control. Research of this model showed that the level of noise voltage was higher in devices with p-n-insulation, and also it was showed considerable influence exercised by the level of input current.
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How to Cite

[1]
“Mathematical noise model of integral operational amplifiers for reliability forecast by the level of low-frequency noise”, Вісник ВПІ, no. 3, pp. 102–108, Nov. 2010, Accessed: Oct. 15, 2026. Available: https://visnyk.vntu.edu.ua/index.php/visnyk/article/view/609

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