Automation and information-measuring equipment
The analysis of the modern multielement photosensors and optoelectronic methods and means on their basis
Keywords
imaging array
pixel
charge-coupled device (ccd)
position sensitive device (psd)
complementary metal-oxide semiconductor (cmos)
Abstract
The next revolution in the 21st century will be caused by combination of cheap optical sensors, microprocessors and lasers, which are the basis of optoelectronic measuring systems. A wide range of photodetectors including PSD, one- and two-dimensional CCD and CMOS imagers, being applied in that sort of systems, are considered in the article.
How to Cite
[1]
“The analysis of the modern multielement photosensors and optoelectronic methods and means on their basis”, Вісник ВПІ, no. 5, pp. 9–15, Nov. 2010, Accessed: Oct. 06, 2026. Available: https://visnyk.vntu.edu.ua/index.php/visnyk/article/view/217
