Features of formation of component structures in-circuit test systems for fails of digital devices

Abstract

This paper analyzes the features of formation of component-based structures relations of fragments of schemes for digital devices. It was found that in the process of constructing subcircuits test cases with elements of idle connections are observed. Such situation makes a decision on re-formation of the inclusion of such components or elements of the final structure of the scheme partition. Properties of hypergraphs, as the models of component structures are considered in the article The article elaborated the mechanisms of integration (deintegration) of elements with idle connections in the final structure of the test. The criteria of estimation of such possibilities for forming of sub-structures of CPU charts are suggested in the paper.