Mathematical model of selfcalibrated DAC with weight surplus failures

Abstract

The primary and second errors of elements of digital-analog and analog-digital converters, their influence on transformation characteristic are considered. Structural diagrams of information converters built on SSN (surplus scale of notation) are suggested. Analytical equations of fault tolerance during the gradual failure are obtained. It is proved that the application of procedure of selfcalibration gives the possibility to reduce considerably errors of conversion characteristic.