Radioelectronics and radioelectronic equipment manufacturing
The methodical deviations evaluation of two-port S-parameters measurement
Keywords
negatronic
two-port
measurement method
s-parameters measurement
deviations evaluation
microwave frequency range
Abstract
A new method of measurement of non-standard system of two-port S-parameters is offered. Experimental verification results of the suggested method are shown. The methodical deviations evaluation results of measurement of each S-parameters are discussed. The offered method has less number of operations in comparison with classic methods and it can be used over the whole microwave frequency range.
How to Cite
[1]
“The methodical deviations evaluation of two-port S-parameters measurement”, Вісник ВПІ, no. 4, pp. 93–99, Nov. 2010, Accessed: Oct. 05, 2026. Available: https://visnyk.vntu.edu.ua/index.php/visnyk/article/view/209
