The methodical deviations evaluation of two-port S-parameters measurement
Keywords:
negatronic, two-port, measurement method, s-parameters measurement, deviations evaluation, microwave frequency rangeAbstract
A new method of measurement of non-standard system of two-port S-parameters is offered. Experimental verification results of the suggested method are shown. The methodical deviations evaluation results of measurement of each S-parameters are discussed. The offered method has less number of operations in comparison with classic methods and it can be used over the whole microwave frequency range.Downloads
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Published
2010-11-12
How to Cite
[1]
M. A. Filyniuk and K. V. Ohorodnyk, “The methodical deviations evaluation of two-port S-parameters measurement”, Вісник ВПІ, no. 4, pp. 93–99, Nov. 2010.
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Section
Radioelectronics and radioelectronic equipment manufacturing
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